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Title: Electro-thermal simulation of microsystems with mixed abstraction modelling
Authors: Jakovljevic, Mirko; Fotiu, PA; Mrcarica, Zeljko; Litovski, Vanco B; Detter, H
Issue Date: 2001
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 41 br. 6 str. 823-835
DOI: 10.1016/S0026-2714(01)00024-5
WoS-ID: 000169464200007
Scopus-ID: 2-s2.0-0035366077
URI: https://enauka.gov.rs/handle/123456789/816510
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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