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eNauka >  Results >  Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy
Title: Measuring depths of sub-micron tracks in a CR-39 detector from replicas using Atomic Force Microscopy
Authors: Yu, KN; Ng, FMF; Nikezic, Dragoslav R 
Issue Date: 2005
Publication: RADIATION MEASUREMENTS
ISSN: 1350-4487 Radiation Measurements Search Idenfier
Type: Article
Collation: vol. 40 br. 2-6 str. 380-383
DOI: 10.1016/j.radmeas.2005.03.011
WoS-ID: 000233487500045
Scopus-ID: 2-s2.0-27744477406
URI: https://enauka.gov.rs/handle/123456789/830859
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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