Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation

Results

Naziv:	Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation
Autori:	Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena; Spassov, Dentcho; Danković, Danijel ;
Godina:	2023
Publikacija:	MIEL : 33rd International Conference on Microelectronics : Proceedings book
Izdavač:	Niš : Institute of Electrical and Electronics Engineers
Tip rezultata:	Konferencijski rad
ISBN:	979-8-3503-4776-0 Pretraži identifikator
Kolacija:	str. 277-280
DOI:	10.1109/MIEL58498.2023.10315932
WoS-ID:	001701718400058
Scopus-ID:	2-s2.0-85183084911
URI:	https://enauka.gov.rs/handle/123456789/861632 https://vinar.vin.bg.ac.rs/handle/123456789/12120
M-kategorija:	Mp kategorija će biti prikazana naknadno.

2
SCOPUS^TM

Altmetric

Dimensions

Unpaywall

Google Scholar^TM