Results
| Title: | Modeling Radiation-Induced Mobility Degradation in MOSFETs | Authors: | Stojadinović, N.; Golubović, S.; Davidović, V.; Đorić-Veljković, S.   ; Dimitrijev, S. |
Issue Date: | 1998 | Publication: | Physica status solidi (a) | ISSN: | 00318965 Physica Status Solidi. A: Applications and Materials Science Search Idenfier |
Publisher: | Germany : The Wiley - VCH Verlag | Type: | Article | Collation: | vol. 169 br. 1 str. 63-66 | DOI: | 10.1002/(SICI)1521-396X(199809)169:1<63::AID-PSSA63>3.0.CO;2-4 | WoS-ID: | 000076351300013 | URI: | https://enauka.gov.rs/handle/123456789/875748 | Metadata source: | (Preuzeto iz CrossRef-a) Đorić-Veljković, Snežana | M-category: | 22M22 |
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