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| Title: | Analysis of radiation absorptance in silicon ultraviolet detector | Authors: | Dankovic, T.; Djuric, Z.  ; Jakšić, Zoran ; Randjelović, Danijela  ; Petrovic, R.; Ehrfeld, W.; Schmidt, A.; Hecker, K. |
Issue Date: | 2000 | Publication: | 2000 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings | Publisher: | Institute of Electrical and Electronics Engineers (IEEE) | Type: | Conference Paper | ISBN: | 0-7803-5235-1  Search Idenfier |
Collation: | vol. 2 str. 585-588 | DOI: | 10.1109/icmel.2000.838759 | Scopus-ID: | 2-s2.0-0033299512 | URI: | https://cer.ihtm.bg.ac.rs/handle/123456789/7787 https://enauka.gov.rs/handle/123456789/928858 |
URL: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0033299512&partnerID=MN8TOARS https://cer.ihtm.bg.ac.rs/handle/123456789/7787 |
Metadata source: | (Preuzeto iz ORCID-a) Ranđelović, Danijela | M-category: | Mp. category will be shown later |
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