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Enhanced Defect Management in Strawberry Processing Using Machine Vision: A Cost-Effective Edge Device Solution for Real-Time Detection and Quality Improvement
| Title: | Enhanced Defect Management in Strawberry Processing Using Machine Vision: A Cost-Effective Edge Device Solution for Real-Time Detection and Quality Improvement | Authors: | Jovanovic, Rodoljub; Djordjevic, Aleksandar |
Issue Date: | 2024 | Publication: | Applied Sciences | ISSN: | 2076-3417 Applied Sciences-Basel Search Idenfier |
Publisher: | MDPI | Type: | Article | Collation: | vol. 14 br. 17 str. 7771 | DOI: | 10.3390/app14177771 | WoS-ID: | 001310932500001 | Scopus-ID: | 2-s2.0-85203634855 | URI: | https://enauka.gov.rs/handle/123456789/931219 https://scidar.kg.ac.rs/handle/123456789/21081 https://scidar.kg.ac.rs/handle/123456789/21084 |
M-category: | 21M21 |