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Browsing by Author Paskaleva, Albena

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)TypeМp-cat.
2021A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETsDanković, Danijel  ; Mitrović, Nikola  ; Veljkovic, Sandra  ; Davidović, Vojkan  ; Đorić-Veljković, Snežana  ; Prijić, Zoran  ; Paskaleva, Albena; Spassov, Dentcho; Golubović, Snežana Conference Paper
Mp. category will be shown later
2023Characterization of the Electric Breakdowns in Metal-Insulator-Silicon Capacitor Structures with HfO2/Al2O3 Layers for Non-Volatile Memory ApplicationsSpassov, Dentcho; Paskaleva, Albena; Guziewicz, Elzbieta; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Danković, Danijel  Conference Paper
Mp. category will be shown later
2017Consideration of conduction mechanisms in high-k dielectric stacks as a tool to study electrically active defectsPaskaleva, Albena; Spassov, Dencho; Danković, Danijel  Article
24M24
2021Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS TransistorsVeljković, Sandra  ; Mitrović, Nikola  ; Đorić-Veljković, Snežana  ; Davidović, Vojkan  ; Manić, Ivica  ; Golubović, Snežana ; Paskaleva, Albena; Spassov, Dentcho; Prijić, Zoran  ; Prijić, Aneta  ;
Stanković, S.  ; Danković, Danijel  ;
Conference Paper
Mp. category will be shown later
2023Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETsVeljković, Sandra  ; Mitrović, Nikola  ; Jovanović, Igor  ; Živanović, Emilija  ; Paskaleva, Albena; Ristić, Goran  ; Danković, Danijel  Conference Paper
Mp. category will be shown later
2019Impact of γ Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD StacksSpassov, Dentcho; Paskaleva, Albena; Davidović, Vojkan S.  ; Đorić-Veljković, Snežana M.  ; Stanković, Srboljub J.  ; Stojadinović, Ninoslav D. ; Ivanov, Tzvetan E.; Stanchev, T.Conference Paper
Mp. category will be shown later
2026Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistorsVeljkovic, S  ; Mitrovic, N; Davidovic, Vojkan S  ; Paskaleva, Albena; Spassov, Dencho; Marjanovic, M; Zivanovic, Emilija N; Ristic, G  ; Dankovic, Danijel MArticle
22M22
2021Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated DielectricsSpassov, Dencho; Paskaleva, Albena; Guziewicz, Elżbieta; Davidović, Vojkan  ; Stanković, Srboljub J.  ; Đorić-Veljković, Snežana  ; Ivanov, Tzvetan; Stanchev, Todor; Stojadinović, NinoslavArticle
21aM21a
2025Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT StressĐorić-Veljković, Snežana  ; Živanović, Emilija  ; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Ristić, Goran  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Conference Paper
Mp. category will be shown later
2022Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature StressVeljković, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Golubović, Snežana ; Đorić-Veljković, Snežana  ; Paskaleva, Albena; Spassov, Dencho; Stanković, Srboljub  ; Andjelković, Marko ; Prijić, Zoran  ;
Manić, Ivica  ; Prijić, Aneta  ; Ristić, Goran  ; Danković, Danijel  ;
Article
22M22