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Browsing by Author Paskaleva, Albena
Showing results 1 to 10 of 10
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2021 | A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETs![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2023 | Characterization of the Electric Breakdowns in Metal-Insulator-Silicon Capacitor Structures with HfO2/Al2O3 Layers for Non-Volatile Memory Applications![]() | Spassov, Dentcho; Paskaleva, Albena; Guziewicz, Elzbieta; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan | Conference Paper | Mp. category will be shown later |
| 2017 | Consideration of conduction mechanisms in high-k dielectric stacks as a tool to study electrically active defects | Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 24M24 |
| 2021 | Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2023 | Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2019 | Impact of γ Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks![]() | Spassov, Dentcho; Paskaleva, Albena; Davidović, Vojkan S. | Conference Paper | Mp. category will be shown later |
| 2026 | Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors | Veljkovic, S | Article | 22M22 |
| 2021 | Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics![]() | Spassov, Dencho; Paskaleva, Albena; Guziewicz, Elżbieta; Davidović, Vojkan | Article | 21aM21a |
| 2025 | Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress![]() | Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2022 | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress![]() | Veljković, Sandra | Article | 22M22 |
