Претрага

Резултати

Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor under Dynamic Stress Conditions [2025]

Đorđević, Dunja; Veljkovic, Sandra ; Ristić, Goran

Thermal Operating Conditions Aspects of the TEG-microporous Ceramic Heatsink Assemblies within the Energy Harvesting Systems [2025]

Stojković, Aleksandra

Reliability of Gas-filled Surge Arresters Subjected to the Gamma Radiation [2025]

Živanović, Emilija ; Veljković, Sandra

Reliability Characterization of n-channel VDMOSFET on Elevated Temperatures [2025]

Aleksić, Sanja ; Pantić, Dragan ; Branković, Neda ; Pantić, Aleksandar ; Petković, Adriana

Is Reliability of Electronic Components Understandable to High School Students? A Workshop-Based Insight from the RESIST Project [2025]

Veljkovic, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel

Influence of Magnetic Field on Commercial P-Channel VDMOSFETs [2025]

Mitrović, Nikola ; Veljkovic, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel

Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress [2025]

Đorić-Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel

Reliability Assessment of a Novel Photoacoustic Method for Material Characterization [2025]

Branković, Neda ; Markušev, Dragana ; Pantić, Dragan ; Aleksić, Sanja ; Markušev, Dragan ; Pantić, Aleksandar

Accuracy and Reliability Analysis of Software Supported Method for Testing the Electrical Power Quality Meters [2025]

Simić, Milan