Pretraga

Rezultati

Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors [2015]

Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav

Boltzmann Equation Analysis of Electron Transport in a N$_{2}$–O$_{2}$ Streamer Discharge [2011]

Dujko, Saša ; Ebert, Ute; White, Ronald D.; Petrović, Zoran

Anisotropy in thermal and electronic properties of single crystal GeSe 2 obtained by the photoacoustic method [1998]

Nikolić, Pantelija; Todorović, Dragan; Vujatović, Stevan; Đurić, S.; Mihailović, P.; Blagojević, Vladimir; Radulović, Katarina ; Bojičić, A.; Vasiljević-Radović, Dana ; Elazar, Jovan;

Urošević, Dragan ;

Mg II 448.1 nm spectral line stark broadening parameters [2005]

Djeniže, Stevan; Srećković, Aleksandar; Bukvić, Srđan

Drift velocities of electrons in time varying electric fields [1999]

Bzenic, S.; Petrovic, Z.L.; Raspopović, Zoran ; Makabe, T.

Relativistic calculations of complete 4fn energy level schemes of free trivalent rare-earth ions [2005]

Ogasawara, K.; Watanabe, S.; Ishii, T.; Brik, M.G.

Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors (Erratum - errors in Authors - vol 38, pg 4699, 1999) [2001]

Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S

Correlation of Structural and Optical Properties of Sputtered FeSi2 Thin Films [2010]

Milosavljević, Momir ; Wong, Lewis; Lourenco, Manon; Valizadeh, Reza; Colligon, John; Shao, Guosheng; Homewood, Kevin P.

Radiography Simulation Based on Exposure Buildup Factors for Multilayer Structures [2009]

Marinković, Predrag; Pešić, Milan P.

Experimental investigation of breakdown voltage and electrical breakdown time delay of commercial gas discharge tubes [2011]

Pejović, Milić ; Pejović, Momčilo ; Stanković, Koviljka