Pretraga
Rezultati
Analogue electronic circuit diagnosis based on ANNs [2006]
Litovski, Vanco B; Andrejevic, Miona VEffects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs
[2003]
Đoric-Veljkovic, Snezana M Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs
[2002]
Stojadinović, Ninoslav A hierarchical approach to large circuit symbolic simulation [2001]
Djordjevic, Srdjan DTemperature dependence of electrical parameters of SMD ferrite components for EMI suppression
[2008]
Stojanovic, Goran M Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs
[2007]
Danković, Danijel Recharging process of commercial floating-gate MOS transistor in dosimetry application
[2021]
Ilić, Stefan D. Implementation and evaluation of 2D SEC-DED forward error correction scheme in wireless sensor networks [2017]
Nikolić, GoranEvaluation of thick-film resistor structural parameters based on noise index measurements
[2001]
Jevtić, M. M.; Stanimirović, Zdravko Low-power fault-tolerant interconnect method based on LCDMA and duplication [2015]
Nikolić, TatjanaFilteri
Po tipu
- 67