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Research outputs
Power saving modes in modern microcontroller design, diagnostics and reliability [2003]
Jankovic, SA; Maksimovic, Dejan MImpact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling [2008]
Videnovic-Misic, Mirjana S
; Jevtic, Milan M
Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode [2008]
Atanassova, E; Stojadinovic, Ninoslav D; Paskaleva, AMultiple high-voltage pulse stressing of conventional thick-film resistors
[2007]
Stanimirović, Ivanka 
; Jevtić, M. M.; Stanimirović, Zdravko
Recharging process of commercial floating-gate MOS transistor in dosimetry application
[2021]
Ilić, Stefan D. ; Anđelković, Marko S.; Duane, Russell; Palma, Alberto J.; Sarajlić, Milija ; Stanković, Srboljub ; Ristić, Goran
Implementation and evaluation of 2D SEC-DED forward error correction scheme in wireless sensor networks [2017]
Nikolić, Goran ; Stojčev, Mile ; Nikolić, Tatjana ; Petrović, Branislav ; Jovanović, Goran ; Dimitrijević, Bojan
NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
[2011]
Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav
A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors [1997]
Savić, Z; Radjenovic, BRF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions [2011]
Milovanović, Vladimir ; van, der Toorn Ramses; Pijper, Ralf
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