Претрага
Резултати
Recharging process of commercial floating-gate MOS transistor in dosimetry application
[2021]
Ilić, Stefan D. 
; Anđelković, Marko S.; Duane, Russell; Palma, Alberto J.; Sarajlić, Milija ; Stanković, Srboljub ; Ristić, Goran
Implementation and evaluation of 2D SEC-DED forward error correction scheme in wireless sensor networks [2017]
Nikolić, Goran ; Stojčev, Mile ; Nikolić, Tatjana ; Petrović, Branislav ; Jovanović, Goran ; Dimitrijević, Bojan
Analysis and validation of neural network approach for extraction of small-signal model parameters of microwave transistors [2013]
Marinković, Zlatica ; Ivković, Nenad; Pronić Rančić, Olivera ; Marković, Vera ; Caddemi, Alina
Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements [2007]
Jevtic, Milan M; Hadzi-Vukovic, Jovan MLow frequency noise as a tool to study optocouplers with phototransistors [2004]
Jevtic, Milan MMechanisms of noise sources in microelectromechanical systems [2000]
Djuric, Zoran G
Influence of controlling signal parameters and prior stresses on the self-heating of VDMOS power transistors [2026]
Veljkovic, S ; Mitrovic, N; Davidovic, Vojkan S ; Paskaleva, Albena; Spassov, Dencho; Marjanovic, M; Zivanovic, Emilija N; Ristic, G ; Dankovic, Danijel M
Negative bias temperature instability in n-channel power VDMOSFETs
[2008]
Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs
[2005]
Stojadinović, Ninoslav ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana
PS-BBICS: Pulse stretching bulk built-in current sensor for on-chip measurement of single event transients
[2022]
Andjelković, Marko S.; Marjanović, Miloš ; Chen, Junchao; Ilić, Stefan ; Ristić, Goran ; Krstić, Miloš
Filteri
Po tipu
- 67