Претрага

Резултати

Recharging process of commercial floating-gate MOS transistor in dosimetry application [2021]

Ilić, Stefan D. ; Anđelković, Marko S.; Duane, Russell; Palma, Alberto J.; Sarajlić, Milija ; Stanković, Srboljub ; Ristić, Goran

Implementation and evaluation of 2D SEC-DED forward error correction scheme in wireless sensor networks [2017]

Nikolić, Goran ; Stojčev, Mile ; Nikolić, Tatjana ; Petrović, Branislav ; Jovanović, Goran ; Dimitrijević, Bojan

A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors [1997]

Savić, Z; Radjenovic, B

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions [2011]

Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav

Transient electro-thermal simulation of microsystems with space-continuous thermal models in an analogue behavioural simulator [2000]

Jakovljevic, Mirko; Mrcarica, Zeljko; Fotiu, PA; Detter, H; Litovski, Vanco B

Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs [2009]

Manić, Ivica ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav

Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs [2001]

Stojadinovic, Ninoslav D; Manic, Ivica Dj ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima

Low-frequency noise in thick-film structures caused by traps in glass barriers [1998]

Mrak, Ivanka ; Jevtić, M. M.; Stanimirović, Zdravko

RPATS – Reliable power aware time synchronization protocol [2014]

Kosanovic, Mirko R.; Stojčev, Mile

Fault-tolerant TMR and DMR circuits with latchup protection switches [2014]

Petrović, V.; Schoof, G.; Stamenković, Zoran