Претрага

Резултати

Power saving modes in modern microcontroller design, diagnostics and reliability [2003]

Jankovic, SA; Maksimovic, Dejan M

Impact of bias condition on 1/f noise of dual-gate depletion type MOSFET in linear region and consequences for noise diagnostic application and modelling [2008]

Videnovic-Misic, Mirjana S ; Jevtic, Milan M

Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode [2008]

Atanassova, E; Stojadinovic, Ninoslav D; Paskaleva, A

Multiple high-voltage pulse stressing of conventional thick-film resistors [2007]

Stanimirović, Ivanka ; Jevtić, M. M.; Stanimirović, Zdravko

(uređivanje) - Uređivanje istaknutog međunarodnog časopisa, Glavni i odgovorni urednik (Editor in chief) [2017]

Recharging process of commercial floating-gate MOS transistor in dosimetry application [2021]

Ilić, Stefan D. ; Anđelković, Marko S.; Duane, Russell; Palma, Alberto J.; Sarajlić, Milija ; Stanković, Srboljub ; Ristić, Goran

Implementation and evaluation of 2D SEC-DED forward error correction scheme in wireless sensor networks [2017]

Nikolić, Goran ; Stojčev, Mile ; Nikolić, Tatjana ; Petrović, Branislav ; Jovanović, Goran ; Dimitrijević, Bojan

NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions [2011]

Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav

A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors [1997]

Savić, Z; Radjenovic, B

RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions [2011]

Milovanović, Vladimir ; van, der Toorn Ramses; Pijper, Ralf