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Research outputs
Low-frequency noise in thick-film structures caused by traps in glass barriers
[1998]
Mrak, Ivanka 
; Jevtić, M. M.; Stanimirović, Zdravko
RF small signal avalanche for bipolar transistor circuit design: Characterization, modeling and repercussions [2011]
Milovanović, Vladimir ; van, der Toorn Ramses; Pijper, Ralf
A method for separating the effects of interface from border and oxide trapped charge densities in MOS transistors [1997]
Savić, Z; Radjenovic, BNBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
[2011]
Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav
Fault-tolerant TMR and DMR circuits with latchup protection switches [2014]
Petrović, V.; Schoof, G.; Stamenković, ZoranRPATS – Reliable power aware time synchronization protocol [2014]
Kosanovic, Mirko R.; Stojčev, Mile
Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs
[2001]
Stojadinovic, Ninoslav D; Manic, Ivica Dj ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima
Multiple high-voltage pulse stressing of conventional thick-film resistors
[2007]
Stanimirović, Ivanka ; Jevtić, M. M.; Stanimirović, Zdravko
Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode [2008]
Atanassova, E; Stojadinovic, Ninoslav D; Paskaleva, AFilters
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