Results
| Naziv: | Reliability Characterization of n-channel VDMOSFET on Elevated Temperatures | Autori: | Aleksić, Sanja   ; Pantić, Dragan ; Branković, Neda ; Pantić, Aleksandar ; Petković, Adriana |
Godina: | 2025 | Publikacija: | First RESIST Workshop: Cross-Layer Reliability Assessment of Electronic Systems – RESIST, Niš, Serbia, 5-7 May 2025 | Izdavač: | Niš : Elektronski fakultet | Tip rezultata: | Informativni prilog | ISBN: | 978-86-6125-285-3  Pretraži identifikator |
Kolacija: | str. 18 | URI: | https://enauka.gov.rs/handle/123456789/1012987 | URL: | https://mikro.elfak.ni.ac.rs/wp-content/uploads/First-RESIST-Workshop-AGENDA-1.pdf | Izvor metapodataka: | (Preuzeto iz ORCID-a) Branković, Neda | M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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