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A Technique for the Characterization of the X-Ray-Induced Leakage Path in a Linear Voltage Regulator
Naziv  : | A Technique for the Characterization of the X-Ray-Induced Leakage Path in a Linear Voltage Regulator | Autori: | Vukić, Vladimir D.   |
Godina: | 2026 | Publikacija: | IEEE Access | ISSN: | 2169-3536 IEEE Access Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 14 str. 47270-47288 | DOI  : | 10.1109/access.2026.3676707 | WoS-ID : | 001731023500022 | Scopus-ID : | 2-s2.0-105034678486 | URI: | https://enauka.gov.rs/handle/123456789/1037501 | Izvor metapodataka: | (Preuzeto iz CrossRef-a) Vukić, Vladimir | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
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