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еНаука >  Резултати >  Investigation of deep implanted carbon and oxygen channeling profiles in [110] silicon, using d-NRA and SEM
Назив: Investigation of deep implanted carbon and oxygen channeling profiles in [110] silicon, using d-NRA and SEM
Аутори: Paneta, Valentina; Erich, Marko  ; Fazinic, S.; Kokkoris, Michael; Kopsalis, I.; Petrović, Srđan M.  ; Tadić, Tonči
Година: 2014
Публикација: Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms
ISSN: 0168-583X Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms Претражи идентификатор
1872-9584 Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms Претражи идентификатор
Тип резултата: Научни чланак
Колација: vol. 320 str. 6-11
DOI: 10.1016/j.nimb.2013.11.020
WoS-ID: 000331428000002
Scopus-ID: 2-s2.0-84890946280
URI: https://enauka.gov.rs/handle/123456789/122836
https://vinar.vin.bg.ac.rs/handle/123456789/5885
Пројекат: Fizika i hemija sa jonskim snopovima (RS-45006)
SPIRIT - Support of Public and Industrial Research using Ion Beam Technology (EU-227012)
Support of Public and Industrial Research Using Ion Beam Technology (SPIRIT) as an Integrated Infrastructure Initiative project
М-категорија: 
21M21 - Водећи међународни часопис категорије M21

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