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eNauka >  Results >  Positive bias temperature instability of irradiated n-channel thin film transistors
Title: Positive bias temperature instability of irradiated n-channel thin film transistors
Authors: Jelenković, Emil V.; Kovačević, Milan  ; Stupar, Dragan Z.; Jha, Shrawan; Bajić, Jovan  ; Tong, K.Y.
Issue Date: 2014
Publication: Thin Solid Films
ISSN: 0040-6090 Thin Solid Films Search Idenfier
Publisher: Elsevier
Type: Article
Collation: vol. 556 str. 535-538
DOI: 10.1016/j.tsf.2014.01.079
WoS-ID: 000333085700086
Scopus-ID: 2-s2.0-84896392055
URI: https://scidar.kg.ac.rs/handle/123456789/12280
https://enauka.gov.rs/handle/123456789/133649
Metadata source: Migrirano iz RIS podataka
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