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Positive bias temperature instability of irradiated n-channel thin film transistors
| Naziv: | Positive bias temperature instability of irradiated n-channel thin film transistors | Autori: | Jelenković, Emil V.; Kovačević, Milan   ; Stupar, Dragan Z.; Jha, Shrawan; Bajić, Jovan ; Tong, K.Y. |
Godina: | 2014 | Publikacija: | Thin Solid Films | ISSN: | 0040-6090 Thin Solid Films Pretraži identifikator |
Izdavač: | Elsevier | Tip rezultata: | Naučni članak | Kolacija: | vol. 556 str. 535-538 | DOI: | 10.1016/j.tsf.2014.01.079 | WoS-ID: | 000333085700086 | Scopus-ID: | 2-s2.0-84896392055 | URI: | https://scidar.kg.ac.rs/handle/123456789/12280 https://enauka.gov.rs/handle/123456789/133649 |
Izvor metapodataka: | Migrirano iz RIS podataka | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
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