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| Title: | Measurement of NBTI Degradation in p-channel Power VDMOSFETs | Authors: | Manić, Ivica Đ.   ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Stojadinović, Ninoslav D. |
Issue Date: | 2014 | Publication: | Informacije Midem. Journal of Microelectronics, Electric Components and Materials | ISSN: | 0352-9045 Informacije Midem. Journal of Microelectronics, Electric Components and Materials Search Idenfier |
Publisher: | MIDEM - Society for Microelectronics, Electronic Components and Materials | Type: | Article | Collation: | vol. 44 br. 4 str. 280-287 | WoS-ID: | 000347315800003 | URI: | https://enauka.gov.rs/handle/123456789/149981 | URL: | http://www.midem-drustvo.si/Journal%20papers/MIDEM_44(2014)4p280.pdf | Metadata source: | Migrirano iz RIS podataka | M-category: | 23M23 |
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