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NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions
| Title: | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions | Authors: | Manić, Ivica   ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2011 | Publication: | MICROELECTRONICS RELIABILITY | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 51 br. 9-11 str. 1540-1543 | DOI: | 10.1016/j.microrel.2011.06.004 | WoS-ID: | 000295568400022 | Scopus-ID: | 2-s2.0-80052955025 | URI: | https://enauka.gov.rs/handle/123456789/153931 | Project: | Ministry of Science of the Republic of Serbia[0171026, TR32026] | Metadata source: | Migracija | M-category: | 22M22 |
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