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| Title: | A 28nm FDSOI 8192-point digital ASIC spectrometer from a Chisel generator | Authors: | Stevo Bailey; John Wright; Nandish Mehta; Rachel Hochman; Robert Jarnot; Milovanović, Vladimir M.   ; Dan Werthimer; Borivoje Nikolić |
Issue Date: | 2018 | Publication: | Proceedings of 2018 IEEE Custom Integrated Circuits Conference (CICC) | ISSN: | 2152-3630  Search Idenfier |
Publisher: | IEEE, San Dijego | Type: | Conference Paper | ISBN: | 978-1-5386-2483-8 Search Idenfier |
URI: | https://enauka.gov.rs/handle/123456789/184249 | URL: | https://ieeexplore.ieee.org/document/8357062 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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