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Reliability of Memories Built from Unreliable Components under Data-Dependent Gate Failures
| Title: | Reliability of Memories Built from Unreliable Components under Data-Dependent Gate Failures | Authors: | Brkić, Srđan  ; Ivaniš, Predrag  ; Vasic, Bane |
Issue Date: | 2015 | Publication: | IEEE COMMUNICATIONS LETTERS | ISSN: | 1089-7798 IEEE Communications Letters Search Idenfier |
Type: | Article | Collation: | vol. 19 br. 12 str. 2098-2101 | DOI: | 10.1109/lcomm.2015.2496266 | WoS-ID: | 000366613300012 | Scopus-ID: | 2-s2.0-84959233211 | URI: | https://enauka.gov.rs/handle/123456789/190894 http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/705721 |
Project: | European Union [309129] Serbian Ministry of Science [TR32028] NSF [CCF-0963726, CCF-1314147, ECCS-1500170] Fulbright Scholar Program |
Metadata source: | Migracija | M-category: | 21M21 |
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