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Title: MEMS Reliability
Authors: Stanimirović, Ivanka  ; Stanimirović, Zdravko  
Issue Date: 2012
Publication: MIEL : 28th International Conference on Microelectronics : Proceedings book
ISSN: 2159-1660 Search Idenfier
Publisher: IEEE
Type: Conference Paper
ISBN: 978-1-4673-0237-1 Search Idenfier
Collation: str. 173-175
DOI: 10.1109/miel.2012.6222826
WoS-ID: 000309119600035
Scopus-ID: 2-s2.0-84864273051
URI: https://enauka.gov.rs/handle/123456789/190927
Metadata source: Migracija
Availability note: Пуни текст није доступан ни у електронској, ни у штампаној форми
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