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Influence of High Voltage Pulse Trimming on Thick-Film Resistor Quality Indicators
| Title: | Influence of High Voltage Pulse Trimming on Thick-Film Resistor Quality Indicators | Authors: | Stanimirović, Ivanka |
Issue Date: | 2017 | Publication: | MIEL : 30th International Conference on Microelectronics : Proceedings Book | ISSN: | 2159-1660![]() Search Idenfier |
Publisher: | IEEE | Type: | Conference Paper | ISBN: | 978-1-5386-2561-3 Search Idenfier |
Collation: | str. 179-181 | DOI: | 10.1109/miel.2017.8190097 | WoS-ID: | 000427499000038 | Scopus-ID: | 2-s2.0-85043568587 | URI: | https://enauka.gov.rs/handle/123456789/190937 | Project: | Ministry for Education, Science and Technological Development of the Republic of Serbia [III44003, III45007] | Metadata source: | Migracija | Availability note: | Пуни текст није доступан ни у електронској, ни у штампаној форми | M-category: | Mp. category will be shown later |
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