Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature

Pejović, Milić; Pejović, Momčilo; Jaksic, Aleksandar B.

Results

eNauka > Results > Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature

Title:	Contribution of fixed oxide traps to sensitivity of pMOS dosimeters during gamma ray irradiation and annealing at room and elevated temperature
Authors:	Pejović, Milić ; Pejović, Momčilo ; Jaksic, Aleksandar B.
Issue Date:	2012
Publication:	Sensors and Actuators A: Physical
ISSN:	0924-4247 Sensors and Actuators A: Physical Search Idenfier
Type:	Article
Collation:	vol. 174 str. 85-90
DOI:	10.1016/j.sna.2011.12.011
WoS-ID:	000300523300012
Scopus-ID:	2-s2.0-84855889606
URI:	https://enauka.gov.rs/handle/123456789/320322
Metadata source:	Migrirano iz RIS podataka
M-category:	21M21

41
SCOPUS^TM

35
OpenCitations

39
WEB OF SCIENCE^TM

Altmetric

Dimensions

Find the DOI

Finding a DOI in CrossRef based on publication meta-data. The DOI (and metadata) with the similar data match will be displayed. ATTENTION - it doesn't have to be that publication.

Unpaywall