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Title: Analysis of SiO2 thin film deposited by reactive sputtering
Authors: Radović, Ivan  ; Serruys, Y.; Limoge, Y.; Jaoul, O.; Romčević, Nebojša Ž.  ; Poissonnet, S.; Bibić, Nataša M.
Issue Date: 2006
Publication: Materials Science Forum
ISSN: 0255-5476 Materials Science Forum Search Idenfier
Type: Article
Collation: vol. 518 str. 149-154
DOI: 10.4028/www.scientific.net/MSF.518.149
WoS-ID: 000239351800026
Scopus-ID: 2-s2.0-37849014254
URI: https://enauka.gov.rs/handle/123456789/338946
https://vinar.vin.bg.ac.rs/handle/123456789/6599
M-category: 
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