Results
| Title: | Analysis of SiO2 thin film deposited by reactive sputtering | Authors: | Radović, Ivan |
Issue Date: | 2006 | Publication: | Materials Science Forum | ISSN: | 0255-5476 Materials Science Forum Search Idenfier |
Type: | Article | Collation: | vol. 518 str. 149-154 | DOI: | 10.4028/www.scientific.net/MSF.518.149 | WoS-ID: | 000239351800026 | Scopus-ID: | 2-s2.0-37849014254 | URI: | https://enauka.gov.rs/handle/123456789/338946 https://vinar.vin.bg.ac.rs/handle/123456789/6599 |
M-category: | 22M22 |
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