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eNauka >  Results >  Radiological characterization of semiconductor materials in field effect transistor dosimeter by Monte Carlo method
Title: Radiological characterization of semiconductor materials in field effect transistor dosimeter by Monte Carlo method
Authors: Stanković, Srboljub J.  ; Ilic, R. D.; Petrović, Milica S.; Lončar, Boris B.; Vasić, Aleksandra  
Issue Date: 2006
Publication: Materials Science Forum
ISSN: 0255-5476 Materials Science Forum Search Idenfier
Type: Article
Collation: vol. 518 str. 361-366
DOI: 10.4028/www.scientific.net/MSF.518.361
WoS-ID: 000239351800060
Scopus-ID: 2-s2.0-37849027770
URI: https://enauka.gov.rs/handle/123456789/361452
https://vinar.vin.bg.ac.rs/handle/123456789/6612
https://machinery.mas.bg.ac.rs/handle/123456789/643
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