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Automation of Standard Cell Characterization in 180nm CMOS process using Open Command Environment for Analysis
| Title: | Automation of Standard Cell Characterization in 180nm CMOS process using Open Command Environment for Analysis | Authors: | Mirković, Dejan D.   ; Stanojlović-Mirković, Milena J. |
Issue Date: | 2018 | Publication: | Proceedings of XIV International SAUM Conference on Systems, Automation, Control and Measurements (SAUM 2018) | Publisher: | University of Nis, Faculty of Electronic Engineering, Serbia, Nis | Type: | Conference Paper | ISBN: | 978-86-6125-205-1  Search Idenfier |
Collation: | str. 69-72 | URI: | https://enauka.gov.rs/handle/123456789/363925 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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