Rezultati
| Title: | Hf-doped Ta2O5 stacks under constant voltage stress | Authors: | Manić, Ivica |
Issue Date: | 2011 | Publication: | Microelectronic Engineering | ISSN: | 0167-9317 Microelectronic Engineering Search Idenfier |
Type: | Article | Collation: | vol. 88 br. 3 str. 305-313 | DOI: | 10.1016/j.mee.2010.11.033 | WoS-ID: | 000287346800018 | Scopus-ID: | 2-s2.0-78650748824 | URI: | https://enauka.gov.rs/handle/123456789/436087 | Metadata source: | Migrirano iz RIS podataka | M-category: | 21M21 |
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