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eNauka >  Results >  Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation
Title: Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation
Authors: Danković, Danijel  ; Manić, Ivica  ; Prijić, Aneta  ; Đorić-Veljković, Snežana  ; Davidović, Vojkan  ; Stojadinović, Ninoslav ; Prijić, Zoran  ; Golubović, Snežana 
Issue Date: 2015
Publication: SEMICONDUCTOR SCIENCE AND TECHNOLOGY
ISSN: 0268-1242 Semiconductor Science and Technology Search Idenfier
Publisher: United Kingdom : IOP Publishing
Type: Article
Collation: vol. 30 br. 10 str. 105009-105009
DOI: 10.1088/0268-1242/30/10/105009
WoS-ID: 000362602300017
Scopus-ID: 2-s2.0-84945156573
URI: https://enauka.gov.rs/handle/123456789/446247
Project: Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026]
Metadata source: Migracija
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