Results
| Title: | Characterization of as implanted silicides by frequency noise level measurements | Authors: | Stojanovic, M; Milosavljević, Momir   ; Jeynes, C |
Issue Date: | 1998 | Publication: | Materials Science Forum | ISSN: | 0255-5476 Materials Science Forum Search Idenfier |
Type: | Article | Collation: | vol. 282-283 str. 153-156 | DOI: | 10.4028/www.scientific.net/MSF.282-283.153 | WoS-ID: | 000075079900021 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/6247 https://enauka.gov.rs/handle/123456789/470192 |
M-category: | Mp. category will be shown later |
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