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eNauka >  Results >  A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
Title: A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors
Authors: Prijić, Aneta  ; Danković, Danijel  ; Vračar, Ljubomir  ; Manić, Ivica  ; Prijić, Zoran  ; Stojadinović, Ninoslav 
Issue Date: 2012
Publication: Measurement Science and Technology
ISSN: 0957-0233 Measurement Science and Technology Search Idenfier
Type: Article
Collation: vol. 23 br. 8 str. 085003-085003
DOI: 10.1088/0957-0233/23/8/085003
WoS-ID: 000306366600011
Scopus-ID: 2-s2.0-84863829082
URI: https://enauka.gov.rs/handle/123456789/507156
Metadata source: Migrirano iz RIS podataka
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