| Naziv: | XAFS and XPS analysis of Zn0.98Fe0.02Te0.91Se0.09 semiconductor |
Autori: | Radisavljević, Ivana   ; Trigueiro, J.; Bundaleski, Nenad ; Medić, Mirjana ; Romčević, Nebojša Ž. ; Teodoro, Orlando M. N. D.; Mitrić, Miodrag ; Ivanović, Nenad |
Godina: | 2015 |
Publikacija: | Journal of Alloys and Compounds |
ISSN: | 0925-8388 Journal of Alloys and Compounds Pretraži identifikator
1873-4669 Journal of Alloys and Compounds Pretraži identifikator |
Tip rezultata: | Naučni članak |
Kolacija: | vol. 632 str. 17-22 |
DOI: | 10.1016/j.jallcom.2015.01.169 |
WoS-ID: | 000350388900003 |
Scopus-ID: | 2-s2.0-84922375565 |
URI: | https://enauka.gov.rs/handle/123456789/560723
https://vinar.vin.bg.ac.rs/handle/123456789/425 |
Projekat: | Optoelektronski nanodimenzioni sistemi - put ka primeni (RS-45003)
ELISA - European Light Sources Activities - Synchrotrons and Free Electron Lasers (EU-226716)
Republic of Serbia [451-03-02328/2012-14/03], Republic of Portugal [451-03-02328/2012-14/03], Portuguese Research Grant through FCT-MEC [Pest-OE/FIS/UI0068/2011] |
M-kategorija: | 21aM21a - Vodeći međunarodni časopis kategorije M21a |
