Results

eNauka >  Results >  Processes in radiation sensitive MOSFETs during irradiation and post irradiation annealing responsible for threshold voltage shift
Title: Processes in radiation sensitive MOSFETs during irradiation and post irradiation annealing responsible for threshold voltage shift
Authors: Pejović, Milić M.  
Issue Date: 2017
ISSN: 0969-806X Radiation Physics and Chemistry Search Idenfier
Publisher: Elsevier
Type: Article
Collation: vol. 130 str. 221-228
DOI: 10.1016/j.radphyschem.2016.08.027
WoS-ID: 000388777200033
Scopus-ID: 2-s2.0-84985998512
URI: https://enauka.gov.rs/handle/123456789/562485
Metadata source: Migrirano iz RIS podataka
M-category: 
21M21

22
SCOPUSTM
8
OpenCitations
19
WEB OF SCIENCETM
Altmetric
Dimensions
Unpaywall

Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.