Rezultati

eNauka >  Results >  Processes in radiation sensitive MOSFETs during irradiation and post irradiation annealing responsible for threshold voltage shift
Title: Processes in radiation sensitive MOSFETs during irradiation and post irradiation annealing responsible for threshold voltage shift
Authors: Pejović, Milić M.  
Issue Date: 2017
ISSN: 0969-806X Radiation Physics and Chemistry Search Idenfier
Publisher: Elsevier
Type: Article
Collation: vol. 130 str. 221-228
DOI: 10.1016/j.radphyschem.2016.08.027
WoS-ID: 000388777200033
Scopus-ID: 2-s2.0-84985998512
URI: https://enauka.gov.rs/handle/123456789/562485
Metadata source: Migrirano iz RIS podataka
M-category: 
21M21

21
SCOPUSTM
8
OpenCitations
17
WEB OF SCIENCETM
Alt metrika
Dimensions
Unpaywall

Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.