Results
| Title: | Total ionizing dose degradation of power bipolar integrated circuit | Authors: | V. Vukić   ; P. Osmokrović |
Issue Date: | 2008 | Publication: | JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS | ISSN: | 1454-4164 Journal of Optoelectronics and Advanced Materials Search Idenfier |
Type: | Article | Collation: | vol. 10 br. 1 str. 219-228 | DOI: | 10.5281/zenodo.10066276 | WoS-ID: | 000252986700034 | URI: | https://enauka.gov.rs/handle/123456789/719903 http://zaposleni.etf.bg.ac.rs/rest/sciNaucniRezultati/oai/record/2/510108 |
M-category: | 22M22 |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.