Results
| Title: | Multiple high-voltage pulse stressing of conventional thick-film resistors | Authors: | Stanimirović, Ivanka |
Issue Date: | 2007 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | Elsevier | Type: | Article | Collation: | vol. 47 br. 12 str. 2242-2248 | DOI: | 10.1016/j.microrel.2006.11.017 | WoS-ID: | 000251484000047 | Scopus-ID: | 2-s2.0-35648936522 | URI: | https://enauka.gov.rs/handle/123456789/768947 | Metadata source: | (Preuzeto iz ORCID-a) Stanimirovic, Zdravko | M-category: | 22M22 |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.