| Title: | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress |
Authors: | Veljković, Sandra   ; Mitrović, Nikola ; Davidović, Vojkan ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Stanković, Srboljub ; Andjelković, Marko ; Prijić, Zoran ;
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Issue Date: | 2022 |
Publication: | Journal of Circuits Systems and Computers |
ISSN: | 0218-1266 Journal of Circuits Systems and Computers Search Idenfier |
Publisher: | Singapore : World Scientific Publishing Co. Pte. Ltd. |
Type: | Article |
Collation: | vol. 31 br. 18 str. 2240003-1-2240003-25 |
DOI: | 10.1142/s0218126622400035 |
WoS-ID: | 000849432300001 |
Scopus-ID: | 2-s2.0-85134418477 |
URI: | https://vinar.vin.bg.ac.rs/handle/123456789/12130
https://enauka.gov.rs/handle/123456789/776661 |
URL: | http://dx.doi.org/10.1142/s0218126622400035 |
Project: | ELICSIR - Enhancement of Sceintific Excellence and Innovation Potential in Electronic Instrumentation for Ionising Radiation Environments
Ministarstvo nauke, tehnološkog razvoja i inovacija Republike Srbije, institucionalno finansiranje - 200102 (Univerzitet u Nišu, Elektronski fakultet) |
Metadata source: | (Preuzeto iz ORCID-a) Mitrovic, Nikola |
M-category: | |
