Results
| Title: | Modeling of NBTI degradation in p-channel VDMOSFETs | Authors: | Mitrović, Nikola   ; Danković, Danijel ; Prijić, Zoran ; Stojadinović, Ninoslav |
Issue Date: | 2020 | Publication: | Journal of Applied Engineering Science | ISSN: | 1451-4117 Journal of Applied Engineering Science Search Idenfier |
Publisher: | Centre for Evaluation in Education and Science ({CEON}/{CEES}) | Type: | Article | Collation: | vol. 18 br. 4 str. 515-519 | DOI: | 10.5937/jaes0-26760 | Scopus-ID: | 2-s2.0-85097883100 | URI: | https://enauka.gov.rs/handle/123456789/776666 | URL: | http://dx.doi.org/10.5937/jaes0-26760 | Metadata source: | (Preuzeto iz ORCID-a) Mitrovic, Nikola | M-category: | 24+M24+ |
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