Results
| Naziv: | Self-heating of stressed VDMOS devices under specific operating conditions | Autori: | Veljković, Sandra   ; Mitrović, Nikola ; Jovanović, Igor ; Živanović, Emilija ; Paskaleva, A.; Spassov, D.; Mančić, Dragan ; Danković, Danijel |
Godina: | 2023 | Publikacija: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | str. 115213-115213 | DOI: | 10.1016/j.microrel.2023.115213 | WoS-ID: | 001106960200001 | Scopus-ID: | 2-s2.0-85174572123 | URI: | https://enauka.gov.rs/handle/123456789/791456 | Projekat: | Ministry of Education, Science, Technological Development and Innovation of the Republic of Serbia [451-03-9/2021-14/200102] Bulgarian National Scientific Fund [KP-06-H37/32] [SPS G5974] |
Izvor metapodataka: | (Preuzeto iz CrossRef-a) Jovanović, Igor | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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