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Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs
| Naziv: | Repeating of positive and negative high electric field stress and corresponding thermal post-stress annealing of the n-channel power VDMOSFETs | Autori: | Aleksic, Sanja M   ; Jaksic, Aleksandar B; Pejovic, Momcilo M |
Godina: | 2008 | Publikacija: | SOLID-STATE ELECTRONICS | ISSN: | 0038-1101 Solid-state Electronics Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 52 br. 8 str. 1197-1201 | DOI: | 10.1016/j.sse.2008.05.004 | WoS-ID: | 000259130700014 | Scopus-ID: | 2-s2.0-48849098295 | URI: | https://enauka.gov.rs/handle/123456789/796496 | Projekat: | Ministry of the Science of the Republic of Serbia [141008B] | Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 21M21 - Vodeći međunarodni časopis kategorije M21 |
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