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| Title: | Radiation effects in low-temperature stressed power VDMOS transistors | Authors: | Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Issue Date: | 2000 | Publication: | 2000 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, CAS 2000 PROCEEDINGS | Type: | Conference Paper | Collation: | str. 337-340 | WoS-ID: | 000168560900066 | URI: | https://enauka.gov.rs/handle/123456789/799747 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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