Rezultati

eNauka >  Results >  Negative bias temperature instability mechanisms in p-channel power VDMOSFETs
Title: Negative bias temperature instability mechanisms in p-channel power VDMOSFETs
Authors: Stojadinović, Ninoslav ; Danković, Danijel  ; Đorić Veljković, Snežana  ; Davidović, Vojkan  ; Manić, Ivica  ; Golubović, Snežana 
Issue Date: 2005
Publication: Microelectronics Reliability
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Publisher: United Kingdom : Elsevier Ltd.
Type: Article
Collation: vol. 45 br. 9-11 str. 1343-1348
DOI: 10.1016/j.microrel.2005.07.018
WoS-ID: 000232253500013
Scopus-ID: 2-s2.0-24144447330
URI: https://enauka.gov.rs/handle/123456789/810034
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
22M22

53
SCOPUSTM
37
OpenCitations
53
WEB OF SCIENCETM
Alt metrika
Dimensions
Unpaywall

Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.