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Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors
| Naziv: | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors | Autori  : | Kouvatsos, DN; Davidovic, Vojkan S   ; Papaioannou, GJ; Stojadinovic, Ninoslav D; Michalas, L; Exarchos, M; Voutsas, AT; Goustouridis, D |
Godina: | 2004 | Publikacija: | MICROELECTRONICS RELIABILITY | ISSN: | 0026-2714 Microelectronics Reliability Pretraži identifikator |
Tip rezultata: | Naučni članak | Kolacija: | vol. 44 br. 9-11 str. 1631-1636 | DOI: | 10.1016/j.microrel.2004.07.082 | WoS-ID: | 000224280000061 | Scopus-ID: | 2-s2.0-4544343899 | URI: | https://enauka.gov.rs/handle/123456789/813363 | Izvor metapodataka: | (Preuzeto iz Nasi u WoS) | M-kategorija: | 22M22 - Međunarodni časopis kategorije M22 |
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