Results

eNauka >  Results >  Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices
Title: Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices
Authors: Vračar, Ljubomir  ; Pešić, Biljana ; Stojadinović, Ninoslav 
Issue Date: 2005
Publication: Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings
Type: Conference Paper
Collation: str. 1159-1162
WoS-ID: 000237248900291
URI: https://enauka.gov.rs/handle/123456789/813595
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
Mp. category will be shown later

Find the DOI

Google ScholarTM

Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.