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Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices
| Title: | Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices | Authors: | Vračar, Ljubomir   ; Pešić, Biljana ; Stojadinović, Ninoslav |
Issue Date: | 2005 | Publication: | Eurocon 2005: The International Conference on Computer as a Tool, Vol 1 and 2 , Proceedings | Type: | Conference Paper | Collation: | str. 1159-1162 | WoS-ID: | 000237248900291 | URI: | https://enauka.gov.rs/handle/123456789/813595 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
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