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Title: New concepts of worst-case delay and yield estimation in asynchronous VLSI circuits
Authors: Sokolovic, Miljana; Litovski, Vanco B; Zwolinski, Mark
Issue Date: 2009
Publication: MICROELECTRONICS RELIABILITY
ISSN: 0026-2714 Microelectronics Reliability Search Idenfier
Type: Article
Collation: vol. 49 br. 2 str. 186-198
DOI: 10.1016/j.microrel.2008.11.007
WoS-ID: 000264270800011
Scopus-ID: 2-s2.0-59449084075
URI: https://enauka.gov.rs/handle/123456789/814982
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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