Rezultati
| Title: | Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs | Authors: | Manić, Ivica   ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2008 | Publication: | IET CIRCUITS DEVICES & SYSTEMS | ISSN: | 1751-8598 IET Circuits, Devices and Systems Search Idenfier |
Type: | Article | Collation: | vol. 2 br. 2 str. 213-221 | DOI: | 10.1049/iet-cds:20070173 | WoS-ID: | 000255251700005 | Scopus-ID: | 2-s2.0-42149161059 | URI: | https://enauka.gov.rs/handle/123456789/815784 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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