Results
| Title: | Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs | Authors: | Manić, Ivica   ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav |
Issue Date: | 2009 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 49 br. 9-11 str. 1003-1007 | DOI: | 10.1016/j.microrel.2009.07.010 | WoS-ID: | 000270611700015 | Scopus-ID: | 2-s2.0-69249217802 | URI: | https://enauka.gov.rs/handle/123456789/816321 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.