Rezultati
eNauka >
Results >
Noise and resistance as indicators of HVP stressing impact on performances of conventional TFRs
| Title: | Noise and resistance as indicators of HVP stressing impact on performances of conventional TFRs | Authors: | Stanimirović, Ivanka P.   ; Jevtić, Milan M.; Stanimirović, Zdravko I. |
Issue Date: | 2008 | Publication: | 26th International Conference on Microelectronics, Vols 1 and 2 : Proceedings | Publisher: | IEEE | Type: | Conference Paper | ISBN: | 978-1-4244-1881-7  Search Idenfier |
Collation: | str. 571-574 | DOI: | 10.1109/ICMEL.2008.4559350 | WoS-ID: | 000257432600121 | Scopus-ID: | 2-s2.0-51749106360 | URI: | https://enauka.gov.rs/handle/123456789/825685 | Metadata source: | (Preuzeto iz Nasi u WoS) | Availability note: | Пуни текст није доступан ни у електронској, ни у штампаној форми | M-category: | Mp. category will be shown later |
Rezultati na eNauka su zaštićeni autorskim pravima i sva prava su zadržana, osim ako nije drugačije naznačeno.