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Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach
| Title: | Analysis of mechanical and electrical straining effects on TFRs - Statistical bimodal conductance approach | Authors: | Stanimirovic, Zdravko I   ; Jevtic, Milan M; Stanimirovic, Ivanka P |
Issue Date: | 2008 | Publication: | 26th International Conference on Microelectronics, Vols 1 and 2 : Proceedings | Publisher: | IEEE | Type: | Conference Paper | ISBN: | 978-1-4244-1881-7  Search Idenfier |
Collation: | str. 575-577 | DOI: | 10.1109/ICMEL.2008.4559351 | WoS-ID: | 000257432600122 | Scopus-ID: | 2-s2.0-51749103760 | URI: | https://enauka.gov.rs/handle/123456789/827725 | Metadata source: | (Preuzeto iz Nasi u WoS) | Availability note: | Пуни текст није доступан ни у електронској, ни у штампаној форми | M-category: | Mp. category will be shown later |
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