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Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs
| Title: | Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs | Authors: | Stojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M   ; Davidović, Vojkan ; Golubovic, Snezana M; Dimitrijev, Sima |
Issue Date: | 2002 | Publication: | Microelectronics Reliability | ISSN: | 0026-2714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier Ltd. | Type: | Article | Collation: | vol. 42 br. 4-5 str. 669-677 | DOI: | 10.1016/S0026-2714(02)00039-2 | WoS-ID: | 000176465800017 | Scopus-ID: | 2-s2.0-0036540086 | URI: | https://enauka.gov.rs/handle/123456789/830908 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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