Results
| Naziv: | Modelling of δv<sub>t</sub> in NBT stressed P-channel power VDMOSFETS | Autori: | Mitrović, Nikola |
Godina: | 2019 | Publikacija: | 2019 IEEE 31st International Conference on Microelectronics, MIEL 2019 - Proceedings | ISSN: | 2159-1679![]() Pretraži identifikator |
Tip rezultata: | Konferencijski rad | ISBN: | 978-1-7281-3419-2 Pretraži identifikator |
Kolacija: | str. 177-180 | DOI: | 10.1109/MIEL.2019.8889584 | WoS-ID: | 000565455600037 | Scopus-ID: | 2-s2.0-85075385957 | URI: | https://enauka.gov.rs/handle/123456789/889237 | Projekat: | Ministry of Education, Science and Technological Development of the Republic of Serbia [OI-171026, TR-32026] Serbian Academy of Sciences and Arts (SASA) [F-148] |
Izvor metapodataka: | Migrirano iz RIS podataka (Preuzeto iz Nasi u WoS) (Preuzeto iz ORCID-a) Danković, Danijel |
M-kategorija: | Mp kategorija će biti prikazana naknadno. |
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