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Title: Thickness measurement of thin films using atomic force microscopy based scratching
Authors: Vasić, Borislav  ; Aškrabić, Sonja  
Issue Date: 2024
Publication: SURFACE TOPOGRAPHY-METROLOGY AND PROPERTIES
ISSN: 2051-672X Surface Topography-Metrology and Properties Search Idenfier
Type: Article
Collation: vol. 12 br. 2 str. 025027-025027
DOI: 10.1088/2051-672X/ad54de
WoS-ID: 001250046700001
Scopus-ID: 2-s2.0-85196437169
URI: https://enauka.gov.rs/handle/123456789/939297
Project: Ministry of Education, Science, and Technological Development of the Republic of Serbia
Institute of Physics Belgrade
Metadata source: (Preuzeto iz Nasi u WoS)
M-category: 
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