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Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor
| Title: | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor | Authors  : | Veljković, Sandra   ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel |
Issue Date: | 2024 | Publication: | Book of Abstracts - RAD 2024 Conference | Type: | Conference Paper | ISBN: | 978-86-901150-7-5  Search Idenfier |
DOI: | 10.21175/rad.abstr.book.2024.35.21 | URI: | https://enauka.gov.rs/handle/123456789/942150 | Metadata source: | (Preuzeto iz CrossRef-a) Mitrović, Nikola | M-category: | Mp. category will be shown later |
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